Restructuring in high burn-up UO<sub>2</sub> fuels: Experimental characterization by electron backscattered diffraction
نویسندگان
چکیده
This paper discusses the use of electron backscattered diffraction to characterize restructuring in a set UO 2 samples, irradiated pressurized water reactor at burn-up between 35 and 73 GWd/t U , including standard samples Cr-doped provide better understanding occurring both on periphery center high-burn-up pellets. The formation high structure was confirmed our experiment. We found associated with bubble all central area, higher irradiation temperatures when exceeded 61 regardless their initial microstructure. tended progress increasing sub-divide grains into sub-grains, orientations close that parent grains. Radial changes differences these showed temperature were not only relevant parameters involved restructuring.
منابع مشابه
Electron energy loss and diffraction of backscattered electrons from silicon
Electrons backscattered from crystals can show Kikuchi patterns: variations in intensity for different outgoing directions due to diffraction by the lattice. Here, we measure these effects as a function of their energy loss for 30 keV electrons backscattered from silicon. The change in diffraction contrast with energy loss depends strongly on the scattering geometry. At steep incidence on the s...
متن کاملQuantification of ridging in ferritic stainless steel sheets by electron backscattered diffraction R-value maps.
In ferritic stainless steel (FSS), undesirable surface defects of ridging appear during deep drawing. The formation of these defects is attributed to the inhomogeneous distribution of orientations of individual grains. In the present work, a new electron backscattered diffraction R(α)-value map was introduced, and the dependence of the tensile directions on the formation of ridging in an FSS sh...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملElectron backscatter diffraction in materials characterization
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
متن کاملElectron Diffraction Electron Diffraction
This guide sheet outlines a method for the analysis of cubic crystal forms, this being useful to you for interpreting the transmission diffraction pattern produced by scattering electrons off a thin film target of polycrystalline aluminium. The apparatus also contains samples with hexagonal structures. These are pyrolytic graphite targets, and are available both as single crystals and in polycr...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2022
ISSN: ['1089-7550', '0021-8979', '1520-8850']
DOI: https://doi.org/10.1063/5.0104865